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(ELEC317)examNote.pdf
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CHEAT SHEET ALLOWED! You can write anything on one side of an A4 size paper. You can even
use photocopy of others' cheat sheet.
TOPICS COVERED AND NOT COVERED:

Elec 317 Exam Guideline (1999)


1-8 Introduction
9-29 Linear systems Covered in exam: separable function, linear function, space and shift invariance, 2D Fourier transform, linearity, scaling, shifting, convolution, Parseval relation, separability, optical and modulation transfer function NOT covered in exam: 25-26, cross correlation, 27, Hankel transform
30-44 Matrix algebra Covered in exam: row and column ordering, transpose, conjugate, addition, multiplication, trace, symmetric/Hermitian matrix, rank, eigenvalues, eigenvectors, eigen-decomposition, transpose rules, trace rules, orthogonal and unitary matrix, positive definite/semidefinite, Toeplitz, linear convolution.
45-64 Image sampling Covered in exam: 1D and 2D sampling theory, interpolation formula. NOT covered in exam: 46-47, scanning/display, 60-64, non-rectangular sampling
65-81 Image Quantization and dithering Covered in exam: uniform quantizer, compander, visual quantization, contrast quantization, dithering, halftoning. NOT covered in exam: 69-71, Lloyd Max quantizer, 73-76, example and Approximate Compander Design
82-118 Image transform Covered in exam: basis function, linear transform, unitary transform, 2D transform, separable unitary transform, basis image, unitary transform properties, discrete Fourier transform, DFT properties, circulant matrix, circular convolution, linear convolution, 2D DFT, properties, conjugate symmetry, Cosine transform NOT covered in exam: 101-103, proof of property 5, 107-111, properties of 2D DFT; 115-118, Sine transform, Hadamard, Haar, KL transform

119-142 Image enhancement
Covered in exam: contrast stretching, clipping, thresholding, negative, intensity slicing, bit extraction, histogram equalization, histogram modification, lowpass filtering, median filtering, crispening, bandpass/highpass filtering, inverse contrast ratio mapping.
NOT covered in exam: 134-142, image magnification, replication, interpolation, transform operation, generalized linear filtering, inverse Gaussian filter, root filtering, multispectral image enhancement, intensity ratio, log ratio, principle component analysis.
143-172 Image restoration (Need only inverse and pseudo inverse filtering) Covered in exam: inverse filtering, pseudo inverse filtering NOT covered in exam: 144-153, image model, noise model. 156-172, Wiener filter, geometric
mean filter, root filter, speckle noise processing, homomorphic filter, extrapolation,
analytic continuation, superresolution, Gerchberg algorithm.
176-227 Image analysis and computer vision
Covered in exam: edge detection, boundary extraction, Fourier descriptor, region growing/splitting/ merging (P.458-465 of our textbook), region representation, moments, structures, medial axis transform, skeleton algorithm (handout, or p. 382 of la